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Overview
Birck supplies a selection of photoresists for both optical and electron beam lithography.
Optical Lithography:
- AZ 1518AZ1518: Positive photoresist, thicknesses from 1-4
- AZ 9260AZ9260: Positive photoresist
- SU8SU-8: Positive resist
Electron Beam Lithography:
- 950 PMMA A4: Positive resist
- XR1541 (HSQ): Negative resist
Section
Subsection
Sub-subsection
References
Optical Photoresists
AZ1518
Composition
Electron Beam Photoresists
950 PMMA A4
Properties
- Composition: 4% polymethylmethacrylate of average molecular weight 950,000 dissolved in anisole.
- Refractive Index: 1.49-1.52 at 632.8nm.
- Good adhesion to most substrates
Manufacturer recommended process: (summarized from Microchem PMMA Data Sheet)
- Solvent clean of substrate.
- Dispense 5 - 8 mL for a 150 mm wafer.
- Ramp to 500 RPM for 5 s OR let sit without rotation for 10 s.
- Quick ramp to spin speed, holding for 45 s.
- Prebake on hot plate at 180 C for 60-90 s.
- Expose with dose between 50-500 μC/cm2 depending on equipment and polymer.
- Development: For high resolution, 1:3 MIBK to IPA. Rinse in IPA or DI water immediately following develop to prevent scumming. Blow dry.
- (Optional) Postbake: 100 C hot plate for 60-90 s. Note that PMMA will reflow above 125 C.
- Removal: Will generally be removed by common positive PR strippers, including acetone. Thorough removal can be accomplished with Remover PG at 50-60 C.