Microsanj NT220 Thermoreflectance Imaging System
iLab Name | |
|---|---|
iLab Kiosk | |
FIC | |
Owner | |
Location | BRK 1153 |
Max. Wafer | 50 mm / 2" |
Info Links | SOP | Internal | Staff |
Overview
General Description
This setup measures sample temperature or temperature change using the thermoreflectance imaging technique with high sensitivity.
This is an example of a tip
This is an example of a tool warning
Specifications
This setup measures sample temperature or temperature change using the thermoreflectance imaging technique with high sensitivity. Measurements can be done in transient imaging mode or steady-state mode. An LED light source with multiple wavelengths (470nm, 530nm, 585nm, 660nm and 780nm) is equipped. Temperature change can be induced by applying a DC bias. The setup operates at room temperature only. Acceptable samples should contain conductive areas/pads for bias application through probes.
Technology Overview - Remove if multiple tools use the same technology/process
Description of the science behind the process. Include figures and diagrams if applicable.
Sample Requirements and Preparation
Samples that may be used in the tool, materials that are compatible/incompatible, and the required cleaning before the tool may be used. May include both an "ideal" clean and a minimum required clean. Also include BOE/oxide removal, dehydration, or any recommended post process steps.
Standard Operating Procedure
Standard procedure for tool operation, base off established Birck SOPs.
Process Control Information
Process Control Context
Process Control Charts
Questions & Troubleshooting
Question about tool use or process result?
Answer to question.
Process Library
Create process template for tool, allows a user to fill in the details of their process.
References
Manufacturer brochures, specifications, papers with relevant info on process, and presentations covering the technology. Confluence lacks a native reference feature, so these are added as links.