Asylum MFP-3D-BIO Atomic Force Microscope

Owned by Former user (Deleted)
Last updated: Feb 05, 2019 by Wirth, Justin C

2024-12-20 to 2025-01-02: Reduced Holiday Operations

Dear Birck Research Community,

The Purdue winter recess begins effective Friday afternoon December 20th and concludes Thursday morning, January 2. The university is officially closed during this time. As we have done in past years, the Birck Nanotechnology Center will remain available for research but will be unstaffed and hazardous gasses will be unavailable. Lab work may otherwise proceed, though any fume hood work must be done with someone else present in the same laboratory or cleanroom bay (the "buddy" system). Click the link above to get more detail about equipment conditions and rules.


Refer to the Material and Process Compatibility page for information on materials compatible with this tool.
Equipment Status: Set as UP, PROBLEM, or DOWN, and report the issue date (MM/DD) and a brief description. Italicized fields will be filled in by BNC Staff in response to issues. See Problem Reporting Guide for more info.

StatusUP
Issue Date and Description


Estimated Fix Date and Comment

Responding Staff


iLab Name: Asylum MFP 3D Bio
iLab Kiosk: BRK Metrology Core
FIC: Arvind Raman
Owner: Arvind Raman
Location: BRK 1081
Maximum Wafer Size: 

Overview

General Description

The MFP-3D-BIOTM AFM provides high resolution images and accurate force measurement in both air and liquid. Features include: Advanced optical capabilities: The MFP-3D-BIO AFM is integrated with an inverted optical microscope (Olympus IX71), supporting optical microscopy techniques like phase contrast and fluorescence microscopy.

  • Environmental controls: vibration isolation; fluid cell; petri dish holder and heater.
  • Lowest noise: 8 pm cantilever deflection noise (typical), 20 pm guaranteed.
  • Closed loop sensors on all three axes provides high precision 3D motion.
  • iDriveTM technique simplifies imaging in liquid, ideal for imaging living biological samples
  • Integrated with confocal microscopy

Specifications

Specifications:

  • X&Y axes: 90µm range in closed loop; resolution 0.5 nm limited only by sensor noise. Sensor linearity better than 0.5%.
  • Z axis: >15 µm range; resolution 0.25 nm limited only by sensor noise. Sensor linearity better than 0.05%.
  • Cantilever deflection measurement: Noise <0.02 nm; typical 0.008 nm. Linearity better than 0.5%. Measures cantilever resonances up to 2 MHz standard.

Technology Overview - Remove if multiple tools use the same technology/process

 

 

Sample Requirements and Preparation

 

Standard Operating Procedure


Questions & Troubleshooting


 

Process Library

References

 The Physics of Atomic Force Microscopy

BioAFM - Bioscope II Training