Page Properties | ||||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ||||||||||||||||||||
|
/wiki/spaces/BNCWiki/pages/6236192
Cambridge Nanotech Fiji ALD - Staff
iLab Name: Fiji200 ALD
iLab Kiosk: BRK Growth Core
FIC: Zhihong Chen
Owner: Mihailo Bradash
Location: Cleanroom - G Bay
Maximum Wafer Size: 8"/200 mm
Table of Content Zone | ||||||||
---|---|---|---|---|---|---|---|---|
| ||||||||
|
Overview
Type | Films Available | Restricted Materials | Available Gases | Wafer Size |
---|---|---|---|---|
Thermal / Plasma ALD | Aluminium Oxide Hafnium Oxide Silicon Oxide Zirconium Oxide | Backside must be clean No outgassing materials in mTorr range No thermally unstable materials | Carrier Gas: Argon Plasma Gases: Argon, Nitrogen, Oxygen, Hydrogen | Small pieces up to full 8 inch wafer. Maximum sample thickness is approximately 6mm. |
gas valve numbers |
---|
0: H2O 10/2022 1: HfO2 06/2023 2: SiO2 06/2023 3: ZrOx 09/2023 4: Al2O3 09/2023 5: N/A |
Growth rates (Thermal) | Growth rates (Plasma) |
---|---|
Al2O3~TBD | Al2O3~TBD |
HfO2~TBD | HfO2~TBD |
SiO2~ N/A | SiO2~0.7 A/cycle |
General Description
Atomic Layer Deposition (ALD) is a technique that takes advantage of self limiting surface reactions, the nature of the reactions ensures atomic-level thickness control and excellent conformality. Following the standard example, growth of Al2O3 film from water and trimethylaluminum (TMA) precursors will be used here to discuss the principle of ALD film growth. Recipes for other materials use different precursors, but are similar in principle and procedure.
Expand | |||||||||||||||||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
ALD Temperature Window
The chemical and physical conditions necessary to obtain self-limiting growth differ for each ALD process. Furthermore, each process is deemed to have a specific temperature window in which ALD behavior is obtained. An idealized temperature window is plotted to the right where the growth per cycle is plotted as a function of temperature. The ideal temperature window represents the temperature range over which the growth per cycle shows weak or no temperature dependence. This is indicated by the horizontal in the plot to the right. Outside the temperature window, chemical and physical processes can disrupt the ALD behavior. Condensation - At low temperatures, some precursors and co-reactants can condense on the surface, leading to an increase in growth per cycle. Low reactivity - The reactivity of the molecules with the surface sites can be too low because of limited thermal energy at low temperatures. This prevents saturation of the reaction and leads to a decrease in growth per cycle. Decomposition - At high temperatures the precursors or co-reactants can decompose, leading to a CVD component and an increase in growth per cycle. Desorption - At high temperatures the film itself or the reactive surface groups involved may desorb or etch. This leads to a decrease in growth per cycle. |
Safety Considerations
Warning |
---|
Danger! Fire Hazard! Trimethylaluminum (TMA) is a liquid at room temperature and is pyrophoric. This means that it burns upon exposure to air. TMA reacts with water vapor in the air. For this reason, the TMA bottle may only be opened in a glove box with inert atmosphere by experienced professionals. Temperature of the precursors and heating jackets should not exceed safety or decomposition temperature of the chemical being used. |
Note |
---|
Maintaining cleanliness and proper function of the system is critical for high quality, low leakage dielectric films. It is the responsibility of all users to follow standard operating procedures and to use the system within the prescribed limitations. |
Note |
---|
You must gain permission from Professor Zhihong Chen and/or the staff engineer before you can be trained for this tool. You will be asked to describe your intended use and sample stack. If you intend to process other substrates and stacks in the future you must first gain permission from Professor Zhihong Chen and/or the staff engineer. Processing substrates or stacks without prior approval may result in chamber contamination due to outgassing/melting of the materials. This will result in loss of privilege to the tool and your PI may be held accountable for the cost of restoring the tool to operating condition. |
Specifications
Available Chemistry
Expand | ||||||||||||||||||||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Thermal Limits
Heater ID | Max Temp |
---|---|
ALD Valves (17) | Remains set to 150 C in all conditions and processes. |
Precursor Delivery (16) | Remains set to 150 C in all conditions and processes. |
Reactor 1 (13) | 250 C |
Reactor 2 (14) | 250C |
Chuck (15) | 500 C |
Cone (12) | 250 C |
Precursor Heating Jacket | 200 C |
RF Plasma Controls
RF Source | Max Power (watts) |
---|---|
ICP Coil | 300 |
Anchor | ||||
---|---|---|---|---|
|
Available Standard Recipes
Expand | ||||||||||||||||||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Location: C:\Cambridge Nanotech\Recipes\
Location: C:\Cambridge Nanotech\Recipes\User recipes\Standard Recipes
Location: C:\Cambridge Nanotech\Recipes\User recipes\High Aspect Ratio Recipes
|
Sample Requirements and Preparation
Sample Specification Clean, vacuum compatible non-outgassing substrates and film stacks. Backside must be clean and free of any metals or photoresist to prevent contaminating the sample carrier. Check with Professor Zhihong Chen or staff engineer for compatibility of your sample. Maximum sample size: Small pieces up to full 200 mm diameter wafer. Approximately 6mm of vertical clearance when inserting the sample carrier, will accommodate thick non traditional samples. Common Substrates: Si, SiO2, GaAs, Glass, Quartz. Common Films (None allowed on backside): Ti, Au, Ag, ......... Not Allowed: ..... | |||
Small Samples Small silicon samples, on the order of 5 x 5 mm and smaller, can be lost in the chamber during pumping. These samples cannot be retrieved. A good solution to this problem is presented in the image to the right. Two glass slides are placed such that they are perpendicular to the loading tool arm. The sample is placed between these two slides to shield the sample from gas flows created by initial pumping and stabilize its position on the chuck.
|
Software Interface Reference
Expand | ||||||||||||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Standard Operating Procedure
Arriving at the Tool
Expand | ||||
---|---|---|---|---|
|
Loading Your Sample
Expand | ||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Recipe Selection and Setup
Expand | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|
|
Running the Recipe
Expand | ||||||
---|---|---|---|---|---|---|
|
Removing Your Sample
Expand | ||||||||
---|---|---|---|---|---|---|---|---|
|
Leaving the Work Area
Expand | ||||||||
---|---|---|---|---|---|---|---|---|
|
Questions & Troubleshooting
How do I know if my growth proceeded as expected?
Anchor | ||||
---|---|---|---|---|
|
Expand | ||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|
The Fiji does not provide direct feedback that ALD growth has taken place. The best indication we can get from the Fiji itself is tool performance throughout the recipe. This is easily checked by reviewing the pressure peaks associated with your growth process. Upon close examination, you will find two sets of peaks, one from the precursor material, and one from the oxidizing material. These pulses alternate on the pressure graph so that one pulse will be precursor (precursor is the very first pulse in standard recipes), followed by oxidizing agent, followed again by precursor and so on for the number of cycles defined in the recipe. In a successful growth, all precursor pulses should be roughly equivalent in peak height and all oxidizer pulses should be roughly equivalent in peak height. Comparing an oxidizer to precursor pulse will only indicate differences/similarities in vapor pressure for the two materials. Also worth noting, the first couple pulses of either precursor or oxidizer may be higher than the remaining process as they have had more time to vaporize while idle. Since ALD is a self limiting process, this should have little to no effect on your growth.
|
I'm receiving a USB failed to connect error message when starting the Fiji control software and logging in as Operator, what should I do?
Anchor | ||||
---|---|---|---|---|
|
Expand | ||||||
---|---|---|---|---|---|---|
|
What are the standard idle conditions?
Anchor | ||||
---|---|---|---|---|
|
Expand | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|
|
Anything else I should know?
Expand | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|
|
References
Per E-mail on 5/8/2018 from Adam Bertuch
Archived - FIJI F200 SOP rev20160926.pdf
View file name FIJI_F200_ALD.pdf height 250 View file name Fiji_F200_V2_installation+and+use+manual.pdf height 250 View file name Fiji_F200_V2_maintenance+manual.pdf height 250