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iLab Name: Thermo Scientific Apreo S
iLab Kiosk: Purdue Electron Microscopy Facility
FIC: Rosa Diaz
Owner: Alejandro Ramirez
Location: Cleanroom - N Bay
Maximum Wafer Size: 6"/150 mm
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Overview
General Description
The most versatile high-performance SEM. The Thermo Scientific™ Apreo scanning electron microscope's (SEM) revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. The Apreo SEM benefits from the unique in-lens backscatter detection, which provides excellent materials contrast, even at tilt, short working distance, or on sensitive samples.
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Electron optics
Detectors
- T1 (BSE), T2 (SE) and T3 (BSE and SE)
- ETD (BSE and SE) Electron Beam Resolution at optimum WD
Optimal Working Distance 10 mm - Inicial Initial working distance (Z direction after focusing and linking the sample point of interest at the 10 mm mark) 5 mm - Optimal working distance (Z direction after focusing and linking the sample point of interest at the 10 mm mark) 2 mm - Best working distance (Z direction after focusing and linking the sample point of interest at the 10 mm mark) NOTE: Always observe your sample, move the stage up from home position towards the 10 mm mark. Focus and link the HIGHEST point of your sample at the 10 mm mark. Electron beam parameter space
Stage and sample
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Sample Requirements and Preparation
Samples should be conductive to maximize sample imaging. With conductive samples features of 10nm can be observed with 5kV. Nonconductive samples can still be imaged, but not small features, limiting smallest resolutions to hundreds of nm, even microns, at low beam voltages (1-5kV). Non-conductive samples can become conductive if they are coated with Carbon, Au-Pd, or Silver paint.
Standard Operating Procedure
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QUICK GUIDE (Complete Guide in computer desktop) i Vent system (wait ~3 minutes) ii Load sample on Multipurpose Stub holder (MSH)
iii Pump system (wait ~3 minutes) iv Take Nav Cam Picture a.Zero x and y coordinates b.Stage – Take Nav-Cam Photo v Define Mode and Detector vi Watch while moving stage holder up slowly until 10mm initial Working Distance is reached
steps the Z-direction of the stage. vii Turn Beam ON
viii Find area of interest. Adjust Magnification, Focus and Link. Fix Stigmation and Alignments. ix Take Picture x Turn Beam Off xi Vent system (wait 3 minutes) xii Unload sample on Universal Standard Holder (USH). xiii Pump system (wait 3 minutes) If needed, open User Guide (Help Tab) or read Apreo Manual |
Questions & Troubleshooting
Any questions? Please write them down here or contact the Electron Microscopy Staff
References
- Inkson, B. J. "Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization." Materials characterization using nondestructive evaluation (NDE) methods. Woodhead Publishing, 2016. 17-43.
- Sharma, Surender Kumar, et al., eds. Handbook of Materials Characterization. Springer International Publishing, 2018.
- Reimer, Ludwig. Scanning electron microscopy: physics of image formation and microanalysis. Vol. 45. Springer, 2013.