Characterization
Characterization Equipment is used to analyze materials and devices down to the nano scale. Included in this category are instruments for microscopy, surface analysis, film characterization, characterization of bulk substrates, and nanoparticle characterization.
For new visitors, Overview of capabilities are described at the top of each topic landing page.
Bio-characterization
Electrical and Magnetic Properties
- Quantum Design DynaCool PPMS
- Cascade PMC 200 DC/RF Probe Station
- EverBeing EB-6 Probe Station
- FormFactor PAV200 Semi-Automatic Vacuum Probe Station
- Jandel 4-point Probe
- Lakeshore CRX-4K Cryogenic Probe Station
- Lakeshore CRX-VF Cryogenic Vertical Field Probe Station
- Lakeshore DC Probe Station
- MDC Mercury Probe
- Microxact CPS-50-HT High Temperature Probe Station
- MM 6000 Cleanroom DC Probe Station
- MM P200L Semi-Automatic Probe Station
- MMR H-50 Hall Effect Station
- Oxford Triton Dilution Refrigerator
- Probe 1 - Cascade MPS150 DC Probe Station
- Suss PLV50 DC Probe Station
- Quantum Design MPMS-3 SQUID Magnetometer
Electron Microscopy
- Hitachi S-4800 Field Emission SEM
- Jeol JCM 5000 Neoscope SEM
- Helios G4 UX Dual Beam - Thermo Scientific
- Themis Z Aberration Corrected Scanning/Transmission Electron Microscope
- EM Sample Prep
- Sample Prep
- Thermo Scientific Apreo SEM
Optical Characterization
- Leica DCM8 Confocal Microscope
- Nikon Eclipse L150 Industrial Microscope
- J.A. Woollam V-VASE UV-VIS-NIR spectroscopic ellipsometer
- Thermo Scientific DXR3xi Raman Imaging Microscope
- Keyence VHX-7000 Digital Microscope + EA-300 Elemental Analyzer
- Keyence VHX-6000 Digital Microscope
- Olympus BX60 System Microscope
- PerkinElmer Lambda950 UV-VIS-NIR spectrophotometer
- Thin Film Stress Machine
- Polytec Laser Doppler Vibrometer
- Kruss DSA25 Drop Shape Analyzer
- J.A. Woollam RC2 Spectroscopic Ellipsometer
- Neaspec IR-Neascope - TERS - NSOM - TEPL
- Neaspec NanoFTIR Ultrafast Pump-probe
- Cleanroom Ellipsometer
- Keyence VK-X3000 Surface Profilometer
- Filmetrics F10-RT
- Filmetrics F40-UV
- Filmetrics F54
- Leica DM8000 M Optical Microscope
- Woollam M-2000 Ellipsometer
- J.A. Woollam IR-VASE Mark II Ellipsometer
Profilometry
- Alpha-Step
- Bruker Optical Profilometer
- KLA-Tencor P-10 Profilometer
- P-17 Profilometer
- P-7 Stylus Profilometer