Page Comparison

Overview

A variety of scanning probe microscopes provide measurements are available.  Samples can be imaged in air or liquid using contact, tapping or lift modes. Measurements include AFM, MFM, EFM, PFM, KPFM, and others.

Visit the tool pages below, or contact engineering manager Ron Reger for more information.

environments.  Measurement modalities include:

• Contact mode measurements of surface structure, roughness, and friction.
• Tapping mode measurements of surface structure, roughness, and phase.
• Force displacement measurements of sample elasticity and adhesion.
• Contact resonance and bimodal (AM-FM) measurements of viscoelastic properties.
• Magnetic force microscopy (MFM) measurements of magnetic forces above the sample.
• Electrostatic force microscopy (EFM) measurements of electrostatic force above the sample.
• Piezoelectric force microscopy (PFM) measurements of the piezoelectric response of the sample.
• Kelvin probe force microscopy (KPFM) measurements of surface potential.

Asylum Cypher S AFM

• Equipped with photothermal actuation
• Housed in a low noise, low RF, environmentally controlled lab
• 30 um x 30 um x 5 um scan volume
• 15 mm diameter sample mount

Asylum MFP-3D-Bio AFM

• Has integrated inverted light microscope with spinning disk confocal capability
• Housed in a BSL2 lab space
• 90 um x 90 um x 15 um scan volume
• Can mount standard optical glass slides

Staff Contact: Ron Reger

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References

CO2 Snow Cleaning - Resurrecting Dirty AFM Calibration Standards.pdf

Nanolithography using AFM

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