Scanning Probe Microscopy

Overview

A variety of scanning probe microscopes are available.  Samples can be imaged in air or liquid environments.  Measurement modalities include:

• Contact mode measurements of surface structure, roughness, and friction.
• Tapping mode measurements of surface structure, roughness, and phase.
• Force displacement measurements of sample elasticity and adhesion.
• Contact resonance and bimodal (AM-FM) measurements of viscoelastic properties.
• Magnetic force microscopy (MFM) measurements of magnetic forces above the sample.
• Electrostatic force microscopy (EFM) measurements of electrostatic force above the sample.
• Piezoelectric force microscopy (PFM) measurements of the piezoelectric response of the sample.
• Kelvin probe force microscopy (KPFM) measurements of surface potential.

Asylum Cypher S AFM

• Equipped with photothermal actuation
• Housed in a low noise, low RF, environmentally controlled lab
• 30 um x 30 um x 5 um scan volume
• 15 mm diameter sample mount

Asylum MFP-3D-Bio AFM

• Has integrated inverted light microscope with spinning disk confocal capability
• Housed in a BSL2 lab space
• 90 um x 90 um x 15 um scan volume
• Can mount standard optical glass slides

Staff Contact: Ron Reger

• Bruker Catalyst AFM
• Asylum MFP-3D-BIO Atomic Force Microscope
• Asylum Cypher
• Park NX20 AFM

References

CO2 Snow Cleaning - Resurrecting Dirty AFM Calibration Standards.pdf

Nanolithography using AFM

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