/
Scanning Probe Microscopy

Scanning Probe Microscopy

Dec 19, 2023

Overview

A variety of scanning probe microscopes are available.  Samples can be imaged in air or liquid environments.  Measurement modalities include:

  • Contact mode measurements of surface structure, roughness, and friction.

  • Tapping mode measurements of surface structure, roughness, and phase.

  • Force displacement measurements of sample elasticity and adhesion.

  • Contact resonance and bimodal (AM-FM) measurements of viscoelastic properties.

  • Magnetic force microscopy (MFM) measurements of magnetic forces above the sample.

  • Electrostatic force microscopy (EFM) measurements of electrostatic force above the sample.

  • Piezoelectric force microscopy (PFM) measurements of the piezoelectric response of the sample.

  • Kelvin probe force microscopy (KPFM) measurements of surface potential.

Asylum Cypher S AFM

  • Equipped with photothermal actuation

  • Housed in a low noise, low RF, environmentally controlled lab

  • 30 um x 30 um x 5 um scan volume

  • 15 mm diameter sample mount

Asylum MFP-3D-Bio AFM

  • Has integrated inverted light microscope with spinning disk confocal capability

  • Housed in a BSL2 lab space

  • 90 um x 90 um x 15 um scan volume

  • Can mount standard optical glass slides

Staff Contact: Ron Reger

References

Nanolithography using AFM

 

Scanning Probe Microscopy - Internal Resources