Versions Compared

Key

  • This line was added.
  • This line was removed.
  • Formatting was changed.


Page Properties
idFunctionality

Equipment Status:Set as UP, PROBLEM, or DOWN. See Problem Reporting Guide for more info.

Status

DOWNShutdown - Longterm

Issue


Estimated Resolution Timeframe




iLab Name: Hall Effect MMR
iLab Kiosk: BRK Characterization Core
FIC:
Tim Sands
Owner: Nithin Raghunathan
Location:
BRK 1217
Maximum Wafer Size: 


Table of Content Zone
locationtop
styledisc

Table of Contents
outlinetrue
indent25px
stylenone


Overview

General Description

Hall effect system for measuring resistivity, mobility, carrier concentration and dopant type of a wide range of samples using the Van der Pauw method.

Specifications

  • Sample size 14mm x 10mm maximum
  • Temperature range 80K-400K
  • Magnetic field 3300G maximum

System components:

  • H-50 Hall, Van der Pauw controller
  • MPS-50 programmable power supply
  • K-20 temperature controller

Technology Overview - Remove if multiple tools use the same technology/process

 

 

Sample Requirements and Preparation

 

Standard Operating Procedure


Questions & Troubleshooting


 

Process Library


References