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Problem Reporting Guide
Problem Reporting Guide
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StatusUP
Issue Date and Description


Estimated Fix Date and Comment
Interlock had an issue, temporarily resolved
Responding StaffNithin Raghunathan



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Page Properties
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iLab Name

Jandel 4-point Probe

iLab Kiosk


FIC


Owner

Nithin RaghunathanNeil Dilley

Location

J Bay

Max. Wafer


Internal Page
Staff Page




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Table of Contents
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Overview

General Description

Tip

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Warning

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Specifications

Technology Overview - Remove if multiple tools use the same technology/process

 

Sample Requirements and Preparation

Standard Operating Procedure

A specialty electronics instruments designed specifically for the four point probe measurement. It features high accuracy, an excellent range, and many features which simplify the four point probing measurement. 

Specifications

Sheet resistance range: 1 milliohm-per-square (10^-3) up to 5 x 10^8 ohms-per-square with 0.3% accuracy.

The volume resistivity range is from 1 milliohm-cm (10^-3) up to 10^6 ohms-cm

Sample Requirements and Preparation

Films, wafers, or any homogeneous and uniform thickness sample. For best accuracy with the 1mm spaced probe tips, diameter > 30mm and thickness < 0.6mm . Otherwise, corrections can be made to the measurements (see SOP or RM3-AR instructions below for details).


Standard Operating Procedure

View file
nameJandel SOP_BNC.pdf
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Questions & Troubleshooting



Process Library


References

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namerm3ar_instructions.pdf
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View file
nameJandel RM3 test DIN plug 100 ohms.pdf
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