Jandel 4-point Probe

Jandel 4-point Probe

 

 

Status

UP

Issue Date and Description

 

Estimated Fix Date and Comment

 

Responding Staff

 

iLab Name

Jandel 4-point Probe

iLab Kiosk

 

FIC

 

Owner

Neil Dilley

Location

J Bay

Max. Wafer

 

Internal Page

 

Staff Page

 

Overview

General Description

A specialty electronics instruments designed specifically for the four point probe measurement. It features high accuracy, an excellent range, and many features which simplify the four point probing measurement. 

Specifications

Sheet resistance range: 1 milliohm-per-square (10^-3) up to 5 x 10^8 ohms-per-square with 0.3% accuracy.

The volume resistivity range is from 1 milliohm-cm (10^-3) up to 10^6 ohms-cm

Sample Requirements and Preparation

Films, wafers, or any homogeneous and uniform thickness sample. For best accuracy with the 1mm spaced probe tips, diameter > 30mm and thickness < 0.6mm . Otherwise, corrections can be made to the measurements (see SOP or RM3-AR instructions below for details).

 

Standard Operating Procedure

Questions & Troubleshooting


 

Process Library


References