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Problem Reporting Guide
Problem Reporting Guide
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iLab Name

Jandel 4-point Probe

iLab Kiosk


FIC


Owner

Neil Dilley

Location

J Bay

Max. Wafer


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Staff Page




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Overview

General Description

A specialty electronics instruments designed specifically for the four point probe measurement. It features high accuracy, an excellent range, and many features which simplify the four point probing measurement. 

Specifications

Sheet resistance range: 1 milliohm-per-square (10^-3) up to 5 x 10^8 ohms-per-square with 0.3% accuracy.

The volume resistivity range is from 1 milliohm-cm (10^-3) up to 10^6 ohms-cm

Sample Requirements and Preparation

Films, wafers, or any homogeneous and uniform thickness sample. For best accuracy with the 1mm spaced probe tips, diameter > 30mm and thickness < 0.6mm . Otherwise, corrections can be made to the measurements (see SOP or RM3-AR instructions below for details).


Standard Operating Procedure

View file
nameJandel SOP_BNC.pdf
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Questions & Troubleshooting



Process Library


References

View file
namerm3ar_instructions.pdf
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View file
nameJandel RM3 test DIN plug 100 ohms.pdf
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