Overview
General Description
Probe Station I consists of a Micromanipulator 6000 probe station in a dark box on top of a vibration isolation table. Like a ll Similar to semiconductor probe stations, theutilised for this is utilized for the electrical testing testing of microfabricated devices. There is a Kiethley SCS4200 Tektronix 4200-SCS Semiconductor Parameter Analyzer for both IV and CV measurements with an embedded PC to collect the data. Details on the parameter analyzer are available here : https://www.tek.com/keithley-4200a-scs-parameter-analyzer-manual-1