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Problem Reporting Guide
Problem Reporting Guide
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StatusDOWNUP
Issue Date and Description5/20/24 - Laser Alignment Problem
Estimated Fix Date and Comment

5/21/24


Responding StaffHarlan/Park




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iLab Name
iLab Kiosk
FIC

Shared

Owner
Location

Cleanroom - Bay P

Max. Wafer

68"/150mm200mm

Info Links/wiki/spaces/BNCWiki/pages/6251230| /wiki/spaces/BNCWiki/pages/6248646




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Table of Contents
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Overview

General Description

Tip

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Warning

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Specifications

Technology Overview - Remove if multiple tools use the same technology/process


 

Specifications

  • Scanner
    • Z scanner (AFM Head): Flexure guided high-force scanner, Scan range: 15um / Typical sample height to measure: <1um
    • XY scanner: Dual-servo closed-loop feedback control for precise XY positioning, Scan range: 100um x 100um / If you would like to scan more than 50um far from the initial engage point, the scanner should be redraw and engage again.
  • Stage
    • XY stage travel range: 200mm
    • Z stage travel range: 25mm
    • Focus stage travel range: 8mm
  • Vision
    • Field of view: 840um x 630um
    • 10 x ultra-long working distance lens 

Technology Overview


Sample Requirements and Preparation


Standard Operating Procedure

  • SOP ()

         

View file
namePark NX20 AFM SOP.pdf
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  • Clip Type Chip Carrier Guide

View file
nameStandard Clip Type Chip Carrier Guide 1.0.0.pdf
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Questions & Troubleshooting



Process Library


References