Park NX20 AFM

Park NX20 AFM

Status

UP

Issue Date and Description

 

Estimated Fix Date and Comment

 

Responding Staff

 

iLab Name

C - Park NX20 AFM

iLab Kiosk

BRK Metrology Core

FIC

Shared

Owner

Joon Park

Location

Cleanroom - Bay P

Max. Wafer

8"/200mm

Info Links

Internal | Staff

Overview

General Description

 

Specifications

  • Scanner

    • Z scanner (AFM Head): Flexure guided high-force scanner, Scan range: 15um / Typical sample height to measure: <1um

    • XY scanner: Dual-servo closed-loop feedback control for precise XY positioning, Scan range: 100um x 100um / If you would like to scan more than 50um far from the initial engage point, the scanner should be redraw and engage again.

  • Stage

    • XY stage travel range: 200mm

    • Z stage travel range: 25mm

    • Focus stage travel range: 8mm

  • Vision

    • Field of view: 840um x 630um

    • 10 x ultra-long working distance lens 

Technology Overview

 

Sample Requirements and Preparation

 

Standard Operating Procedure

  • SOP (Jun 13, 2022)

  • Clip Type Chip Carrier Guide

Questions & Troubleshooting


 

Process Library


References