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CrossLab Name: Hall Effect MMR
FIC: Tim Sands
Owner: Nithin Raghunathan
Location: BRk 1217
Maximum Wafer Size: 

Overview

General Description

Hall effect system for measuring resistivity, mobility, carrier concentration and dopant type of a wide range of samples using the Van der Pauw method.

Specifications

  • Sample size 14mm x 10mm maximum
  • Temperature range 80K-400K
  • Magnetic field 3300G maximum

System components:

  • H-50 Hall, Van der Pauw controller
  • MPS-50 programmable power supply
  • K-20 temperature controller

Technology Overview - Remove if multiple tools use the same technology/process

 

 

Sample Requirements and Preparation

 

Standard Operating Procedure


Questions & Troubleshooting


 

Process Library

References

 

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