CHA E-Beam Evaporator #2

CHA E-Beam Evaporator #2



Status

Up

Issue Date and Description

11/14/2025 Replacement of Cryopump complete. Testing of system is complete.

9/23/25 Cryopump failed. System will be down for approx 4-6 weeks.

7/17/2025 Top flange on chamber o-ring fail. Regeneration of cryopump is necessary.

4/9/25 Regeneration of Cryopump complete.

4/7/25 Student crashed the Cryopump.  Down for regeneration.3/27/2025 Cryo showing sudden poor performance - either partial failure of the motor drive or contamination in the He line

Estimated Fix Date and Comment

0718/2025, regeneration finished, system back online.07/18/2025

4/9/25. 4/1/2025 Successful regeneration. He lines may need purge soon but tool is operating normally

Responding Staff

Dave Lubelski/Dan Witter




iLab Name

C - CHA E-Beam Evaporator #2

iLab Kiosk

BRK Evaporation Sputtering Core

FIC

Shared

Owner

Dave Lubelski

Location

Cleanroom - L Bay

Max. Wafer

4"/100 mm

Internal Page



Staff Page

Staff - CHA E-Beam Evaporator #2



Current Sources

Ti, Ag, Ni, Au, Pt, Al

Potential Sources

Ti, Au, Pt, Al, Ni, Ge, Cr, Ag, NiCr (80/20)

Overview

General Description

General Description

  • Telemark  861 deposition controller

  • Six pocket e-beam evaporator

  • Pockets hold 8.2 cc crucible liners

  • Substrate fixture can hold 1- 6" wafer  4"  wafers with adapters for a 3" wafer, 2" wafer, and fragments of wafers

  • Water cooled stage

Specifications

  • Source Materials: Ti, Au, Al, Ni, Ge, Ag

  • Deposition rates range from 1 - 4.0 Angstroms/sec

  • Quick pump down to 5x10-7 torr
     

        RESULTS FROM TOOL CHARACTERIZATION  AS OF 1/24/2020

material deposited on clean pattered wafer 

deposition rate

thickness setting

characterized result

using PR  lift off process measured on P7







CHA2







Ti

2 a/s

50 nm

49.9 nm

Au

2 a/s

50 nm

49.4nm

Ni

2 a/s

50 nm

48.3 nm

Pt

2 a/s

50 nm

51 nm

Ag

2 a/s

50 nm

48.8 nm

Ge

2 a/s

50 nm

49.8 nm

Ti

1 a/s

5 nm

5nm

Ti/Au

Ti 1 a/s  Au 2/as

5 nm Ti  50nm Au

54.8nm

 



Sample Requirements and Preparation

        Make sure your sample has been properly Baked when using PR or PMMA.  

        Substrates must be solvent cleaned in the standard 3 step Toluene, Acetone, and IPA solvent clean.

Samples must be cleaned in accordance to processing needs     NO FLEXIBLE SUBSTRATES OF ANY KIND ARE ALLOWED IN THIS TOOL