Cleanroom Supplied Chemicals
For use in Acid Hoods
Acids
Acetic Acid
Buffered Oxide Etch (6:1 HF with NH4F buffer)
CR14S Chromium etch
Hydrochloric Acid
Nanostrip 2x
Nitric Acid
Phosphoric Acid
Sulfuric Acid
Hydroflouric Acid
Concentrated Bases
Ammonium Hydroxide
Tetramethlyammonium hydroxide
Oxidizers
Hydrogen Peroxide
For use in Solvent Hoods
Solvents
Chlorobenzene
HMDS
PRS 2000 (NMP mixture)
Remover PG (99% NMP)
Xylene
Acetone
Isopropanol
Methanol
Toluene
MIBK/IPA 1:3
SU-8 Developer (PGMEA)
For use in Lithography Hoods (Solvent Hoods with Sinks and Yellow Light)
May use chemicals for use in Solvent Hoods, EXCEPT PRS 2000 or Remover PG, plus:
Non-Concentrated Basic Developers
AZ Developer
Na based for high selectivity with DNQ photoresists, main appeal is lack of Al etch
AZ 340
Na based, needs custom dilution, with higher dilutions for thinner resists to improve process control, and lower dilutions to improve development rate.
AZ 400K
1.4 N Buffered KOH used in 1:4 dilution, buffered with potassium borate. Recommended for thick resists
MF-26A
0.26N TMAH w/ Polyglycol surfactant
Photoresists
AZ1518
AZ9260
E-Beam Resists
HSQ
950 PMMA A4
AR-P 6200.13
Common Additional Lithography Chemicals (Non-stocked)
S1800 series
PGMEA + Novolak & DNQ
SPR 220
Thick positive resist, Anisole + Ethyl lactate
ZEP
Anisole + Methylstyrene & Methyl Alpha-Chloroacrylate. AR-P 6200 is chemically identical
LOR 3A
Lift off resist, Cyclopentanone + PGME
MCC Primer 80/20
HMDS + PGMEA
SU-8