Omicron Surface Analysis Cluster

Omicron Surface Analysis Cluster

Status

UP

Issue Date and Description

 

Estimated Fix Date and Comment

 

Responding Staff

Dmitry Zemlyanov

iLab Name: Omicron Surface Analysis Cluster
iLab Kiosk: BRK Metrology Core
Owner: Dmitry Zemlyanov
Location: BRK 1077
Maximum Wafer Size: N/A

Overview

General Description

  • High-Resolution Electron Energy Loss Spectrometer (HREELS)

  • Ultra-High Vacuum Scanning Tunneling Microscope and Atomic Force Microscope (UHV STM/AFM)

  • X-ray photoelectron Spectroscopy (XPS)

  • Low Energy Electron Diffraction (LEED)

  • Sample cleaning/treatment: Ar Sputtering, Heating at 650C, expose to various gases

Specifications

Technology Overview

 

 

Sample Requirements and Preparation

 

Standard Operating Procedure

Questions & Troubleshooting


 

Process Library


References