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Fabrication
Characterization
Bio-characterization
Electrical and Magnetic Properties
Electron Microscopy
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Hitachi S-4800 Field Emission SEM
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Thermo Scientific Apreo SEM
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Jeol JCM 5000 Neoscope SEM
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Helios G4 UX Dual Beam - Thermo Scientific
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Themis Z Aberration Corrected Scanning/Transmission Electron Microscope
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EM Sample Prep
Sample Prep
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SPI Sputter and Carbon Coaters for SEM
Optical Characterization
Profilometry
Roll-to-Roll Characterization
Scanning Probe Microscopy
Surface Characterization
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Bio Cleanroom
Birck Nanotechnology Center Wiki
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Electron Microscopy
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Sample Prep
Sample Prep
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alcarazr (Unlicensed)
May 07, 2020
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