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Highlights

• Near-field Scanning Optical Microscopy (SNOM) using an Optical Parametric Oscillator (OPO) laser tunable from ~1.5 um to ~18 um.

• Nano-Raman/Photoluminescent spectroscopy with 532 excitation laser up to 950-nm sensing range.

• Tip-enhanced Photocurrent Measurement.

• Kelvin Probe Force Microscopy.

• Tip Force Microscopy.

• Piezo Force Microscopy.

• Conductive Atomic Force Microscopy.

Overview

General Description

Instrument is used for characterization of materials in nanoscale via near-field optical imaging, Raman and photoluminescent spectroscopy.

Can operate in different modes:

• Near-field Scattering Optical microscopy (NSOM) over broad frequency range

• Tip-enhanced Raman Spectroscopy (TERS)

• Tip-enhanced Photoluminescence (TEPL)

Specifications

Numerical specifications of tool performance and abilities, either from manufacturer or those seen in operation. Also include material compatibility and incompatibility.

Technology Overview - Remove if multiple tools use the same technology/process

 Description of the science behind the process. Include figures and diagrams if applicable.

Sample Requirements and Preparation

Samples that may be used in the tool, materials that are compatible/incompatible, and the required cleaning before the tool may be used. May include both an "ideal" clean and a minimum required clean. Also include BOE/oxide removal, dehydration, or any recommended post process steps.

Standard Operating Procedure

Standard procedure for tool operation, base off established Birck SOPs.

Process Control Information

Process Control Context

Process Control Charts

Questions & Troubleshooting

Question about tool use or process result?
Answer to question.

Process Library

Create process template for tool, allows a user to fill in the details of their process. 

References

Manufacturer brochures, specifications, papers with relevant info on process, and presentations covering the technology. Confluence lacks a native reference feature, so these are added as links.