Characterization
- Wirth, Justin C
- Neil Dilley
- Former user (Deleted)
Owned by Wirth, Justin C
Characterization Equipment is used to analyze materials and devices down to the nano scale. Included in this category are instruments for microscopy, surface analysis, film characterization, characterization of bulk substrates, and nanoparticle characterization.
For new visitors, Overview of capabilities are described at the top of each topic landing page.
Bio-characterization
Electrical and Magnetic Properties
- Quantum Design DynaCool PPMS
- Cascade PMC 200 DC/RF Probe Station
- EverBeing EB-6 Probe Station
- FormFactor PAV200 Semi-Automatic Vacuum Probe Station
- Jandel 4-point Probe
- Lakeshore CRX-4K Cryogenic Probe Station
- Lakeshore CRX-VF Cryogenic Vertical Field Probe Station
- Lakeshore DC Probe Station
- MDC Mercury Probe
- Microxact CPS-50-HT High Temperature Probe Station
- MM 6000 Cleanroom DC Probe Station
- MM P200L Semi-Automatic Probe Station
- MMR H-50 Hall Effect Station
- Oxford Triton Dilution Refrigerator
- Probe 1 - Cascade MPS150 DC Probe Station
- Quantum Design MPMS-3 SQUID Magnetometer
- Suss PLV50 DC Probe Station
Electron Microscopy
- Hitachi S-4800 Field Emission SEM
- Thermo Scientific Apreo SEM
- Jeol JCM 5000 Neoscope SEM
- Helios G4 UX Dual Beam - Thermo Scientific
- Themis Z Aberration Corrected Scanning/Transmission Electron Microscope
- EM Sample Prep
- Sample Prep
Optical Characterization
- Leica DCM8 Confocal Microscope
- Nikon Eclipse L150 Industrial Microscope
- Cleanroom Ellipsometer
- Filmetrics F10-RT
- Filmetrics F40-UV
- J.A. Woollam V-VASE UV-VIS-NIR spectroscopic ellipsometer
- Thermo Scientific DXR3xi Raman Imaging Microscope
- Keyence VHX-950F Digital Microscope
- Olympus BX60 System Microscope
- PerkinElmer Lambda950 UV-VIS-NIR spectrophotometer
- Thin Film Stress Machine
- Polytec Laser Doppler Vibrometer
- Kruss DSA25 Drop Shape Analyzer
- J.A. Woollam RC2 Spectroscopic Ellipsometer
- Neaspec IR-Neascope - TERS - NSOM - TEPL
- Neaspec NanoFTIR Ultrafast Pump-probe
Profilometry
Roll-to-Roll Characterization
Scanning Probe Microscopy
Surface Characterization
- Kratos X-ray Photoelectron Spectrometer
- Omicron Surface Analysis Cluster
- Panalytical X'pert Pro (XRD)
- Glovebox - BRK 1077
- Glovebox - Kratos Axis Ultra DLD XPS